Replacement Cesium Source Head for a Secondary Ion Mass Spectrometry Instrument

The National Institute of Standards and Technology (NIST) needs an urgent replacement of a non‑functional Cesium Source Head for its Time‑of‑Flight Secondary Ion Mass Spectrometry (ToF‑SIMS) instrument. NIST intends to award the purchase on a sole‑source basis to ION‑TOF USA, Inc., the only vendor authorized to service and provide spare parts for the IONTOF range of surface‑analysis equipment. Interested parties may submit responses by the deadline, though the award will be made without a competitive solicitation. • Replacement of a specific analytical instrument component (Cesium Source Head). • Sole‑source justification based on exclusive vendor capability. • NAICS 334516 (Analytical Laboratory Instrument Manufacturing) applies; small business size cap 1,000 employees. • Deadline for response: 11/07/26, 1:00 AM EST. • No formal solicitation package will be issued; responses are for informational purposes only.