Invitation to Bid for Benchtop Scanning Electron Microscope

Texas A&M University is seeking a qualified vendor to supply, install, and provide a one‑year (minimum) warranty for a benchtop scanning electron microscope (SEM) system, including a JEOL EDS 30 mm detector, associated software, motor‑drive holder, tungsten filaments, and related shipping and warranty services. The contract will be awarded to the lowest responsive and responsible bidder who meets the technical specifications and Texas‑state subcontracting and insurance requirements. • Core equipment: JCM‑7000 (or equivalent) benchtop SEM with JEOL EDS 30 mm detector. • Required accessories: Standard EDS software, tilt‑rotation motor‑drive holder, V‑type tungsten filament (box of 6), 1‑year extended service contract, and shipping. • Vendor obligations: Provide detailed product literature, comply with export‑control classifications, furnish a minimum one‑year warranty, assume FOB Destination freight‑prepaid shipping, and meet extensive insurance (CGL, auto, workers’ comp, umbrella) and Texas HUB subcontracting plan requirements.