Physical Vapor Deposition

The California State University, Long Beach’s Hung Family College of Engineering is seeking qualified vendors to supply a Focused Ion Beam Scanning Electron Microscope (FIB SEM). The instrument must be a fully digital, ultra‑high‑resolution field‑emission scanning electron microscope equipped with focused ion‑beam capabilities for nanometer‑scale 2‑D/3‑D analysis, high‑quality thin‑sample preparation, and in‑situ materials testing. This procurement is an RFP with a single submission deadline and will be awarded to the vendor offering the best technical solution and price. • Provide a complete FIB SEM system (hardware, software, accessories, installation, and training). • Ensure the instrument meets high‑resolution imaging and ion‑beam specifications required for advanced research. • Include warranty, service, and support agreements as part of the delivery package.