Description
The National Institute of Standards and Technology (NIST) is conducting market research to identify potential sources that can provide an electrical performance monitoring system. The system should be capable of generating time-resolved data necessary to populate an open-source physical property database. This system will support NIST research related to reliability of advanced packaging in heterogeneously integrated semiconductor devices.
• The system shall enable detection of failure initiation and collection of real-time degradation data necessary to characterize aging behavior in heterogeneously integrated devices.
• The system should provide controlled, accurate current for multiple test vehicles for in-situ resistance measurements during multi-stress accelerated aging tests.
• The project aims to improve the accuracy of lifetime prediction models and support the objectives of the CHIPS Metrology Program Grand Challenge 3.