High Power Probestation

Texas State University is seeking a high-power probestation for electrical characterization research in semiconductor and device development. The system must have a wafer pull out chuck, support low-noise test environment, and be compatible with high-power device analyzers. The vendor must provide on-site installation, user training, and a 12-month parts-and-labor warranty. • The system will be used for research in materials science, physics, and electrical engineering. • The system must support I-V measurements of at least 3kV/20A for both lateral and vertical device configurations. • The system must support capacitance-voltage (C-V) measurements across various frequency ranges for both lateral and vertical device configurations. • The vendor must document at least five U.S. installations of comparable systems. • The vendor must commit to on-site installation, user training, and U.S.-based repair and support availability.