Sources Sought Notice for CHIPS R&D Data Acquisition System

The National Institute of Standards and Technology (NIST) is seeking information from manufacturers capable of providing a Data Acquisition System to collect in-situ resistance-based measurements throughout the structure of advanced test vehicles during accelerated aging experiments. The system should be able to accommodate 300-400 channels, have a minimum scan rate of 100 channels/second, and be compatible with 2-wire and 4-wire resistance-based measurements. The system should also have data logging software with data analysis and export capability, and be compatible with Windows 10/11. • The system will be used to measure resistance and resistance-based temperature changes throughout an interposer structure during accelerated aging. • The system should be able to accommodate 300-400 wires for each sample. • Low current/voltage measurements are required, with expected resistance measurements not exceeding 5V. • The system should have screw connections for input wires and include data logging software with data analysis and export capability. • The system should be compatible with Windows 10/11.