Two (2) Highly Accelerated Stress Test (HAST) Chamber

The National Institute of Standards and Technology (NIST) is seeking a Highly Accelerated Stress Test (HAST) Chamber capable of meeting the JESD22A11E standard to perform accelerated aging experiments as part of a study of long-term reliability of materials used in advanced packaging of semiconductor chips. The HAST chamber will allow for accelerated aging at variable temperature, humidity, and pressure to study the effect of thermal environment, including direct in-situ temperature and resistance monitoring throughout samples, of polymeric components used in advanced packaging of heterogeneously integrated semiconductors. The key requirements of the HAST chamber include: • Accommodating multiple samples up to 280 mm in diameter • Having a minimum of two shelves (not including the bottom shelf) • Having a minimum of 21 L interior volume • Meeting the JESD22A11E standard testing • Having built-in water supply tank • Providing power requirements, required receptacle, and plug (if required) The contractor shall deliver the HAST chamber to NIST, Gaithersburg, MD, and install it within three weeks after delivery. The contractor shall also conduct an onsite training session for up to five users at NIST.