CHIPS Microchannel plate gate upgrade module– Combined Sources Sought/Notice of Intent to Sole Source

The National Institute of Standards and Technology (NIST) is seeking information from sources that may be capable of providing a microchannel plate gate upgrade module for their existing LEAP 4000 X-Si atom probe microscope. The module should be able to gate the MCP detector, decrease the voltage on the MCPs, and enable the detector to act as a fast shutter to ignore specific signals in a defined TOF window. The module should also accommodate pulse frequency rates from 100 kHz to 200 kHz. • The MCP gate module upgrade shall be installed on an existing CAMECA LEAP 4000 X-Si instrument (S/N 5020) at NIST Boulder Laboratories. • The MCP gate module upgrade shall include any necessary hardware including high voltage supply, timing electronics, cables, etc. • The MCP gate module upgrade shall allow for gating our TOF mass spectrometry signal to ignore specific timing events of NIST choosing. • Control and operation of the MCP gate shall be fully integrated into the existing CAMECA LEAP 4000 X-Si instrument and controlled through a digital delay generator (supplied by NIST).