Large Sample Stage Cryostat

The National Institute of Standards and Technology (NIST) is seeking a Large Sample Stage Cryostat to support advanced cryogenic characterization of mixed-signal digital and analog circuits, as well as semiconductor devices, at temperatures down to 4.2 K. The cryostat will support simultaneous DC, RF, and optical access to accommodate realistic operating conditions for complex electronic subsystems. The system is critical to sustaining and expanding NIST’s cryo-electronics measurement capabilities and to providing a robust, measurement-driven foundation for cryogenic circuit and system development. Key requirements include: * Cooling performance: minimum cooling power of 2 W at 4.2 K * Cold plate size and geometry: 4 K cold plate with diameter greater than Ø250 mm and height of approximately 200 mm * Thermal cycling performance: cool-down time of a minimum of 90 minutes from room temperature to base temperature and warm-up time of a minimum of 120 minutes from base temperature to room temperature * Electrical access: support for a minimum of 50 DC lines and 30 RF lines, with at least two RF lines supporting frequencies above 60 GHz * Optical and fiber access: support for more than one fiber-optic feedthrough and more than one optical access port to the sample space * Application compatibility: suitable for simultaneous digital and analog mixed-signal circuit testing, including wafer-level or packaged device measurements at cryogenic temperatures