Awarded vendors
- Keyence Corporation of America
Description
Austin Community College District issued an RFP for a single benchtop three‑dimensional optical surface profilometer system to support its Advanced Manufacturing program at the Riverside Campus. The award includes the complete hardware system, software, delivery, installation, a one‑year manufacturer’s warranty, optional extended warranty, and on‑site or virtual training to be completed within 30 days of acceptance. The solicitation attracted at least one bid, which was awarded to Keyence Corporation of America. The contract follows a best‑value evaluation (price, technical compliance, training/warranty quality, past performance, and completeness). Key requirements include film‑thickness measurement from micrometer to nanometer scale, surface‑roughness/topography mapping, grain‑structure imaging, and SEM‑quality imaging using focus‑variation, confocal microscopy, and white‑light interferometry.
• Procurement by a Texas public college (ACC) for advanced manufacturing education.
• Equipment: benchtop 3‑D optical profiler with full system integration, warranty, and training.
• Awarded to Keyence Corp. of America; single‑award, full‑price procurement.
• Key dates: solicitation released Feb 10 2025, proposal deadline Mar 3 2025, award Apr 22 2025, performance start Apr 25 2025.