SEM detector (ePix EFE TPX3 detector)

The National Institute of Standards and Technology (NIST) is seeking information from sources that may be capable of providing a solution for a SEM detector that can be used in a conventional scanning electron microscope to collect electron diffraction patterns at a fast rate on samples comprising 2D material-based devices. The detector should have specific technical specifications, including a vacuum-compatible TPX3 detector with extended front-end electronics, a heatsink with Peltier cooling and PID control, and a metallic enclosure for a standard camera port. The solution should also include a manual detector retract mechanism and installation and training services. • The solution should meet the technical specifications outlined in the document. • The solution should be able to collect electron diffraction patterns at a fast rate on samples comprising 2D material-based devices. • The solution should include a manual detector retract mechanism and installation and training services. • The respondent should provide information about their company, including their name, address, and contact information. • The respondent should provide information about the equipment they are recommending, including the manufacturer name, model number, and technical specifications.