Description
The National Institutes of Health (NIH) is seeking a maintenance and service agreement for a Zeiss Crossbeam 540 Focused Ion Beam-Scanning Electron Microscope (FIB-SEM) instrument. The agreement will provide scheduled preventive maintenance, corrective repair services, parts, labor, and software installation services necessary to keep the instrument operating within manufacturer specifications. The contract is expected to be awarded on a non-competitive basis to Carl Zeiss Microscopy, LLC. Key aspects of the agreement include:
• Coverage of the Crossbeam 540 base microscope system and associated components
• One scheduled on-site preventive maintenance visit per contract year
• Unscheduled on-site corrective repair services, including all associated parts and labor
• Remote diagnostic and telephone support during normal business hours
• Software installation services associated with manufacturer-released updates
• Factory-trained, authorized service technicians for all on-site work