Notice of Intent to Noncompetitively Acquire CHIPS LEAP 6000 R Atom Probe Instrument

The National Institute of Standards and Technology (NIST) intends to noncompetitively acquire a CHIPS LEAP 6000 R Atom Probe Instrument. The instrument will be used for materials characterization efforts to support multiple projects, including the study of the effect of novel laser wavelengths on semiconductor materials. The instrument must meet specific minimum requirements, including the use of local electrodes, a 2-dimensional position-sensitive ion detector, and the ability to use specimen array coupons. The contractor will deliver and install the instrument, provide in-person training, and cover the system under warranty for at least one year. Some key features of the instrument include: • The ability to use local electrodes for efficient data collection • A 2-dimensional position-sensitive ion detector with high detection efficiency and mass resolving power • The ability to use specimen array coupons for efficient data acquisition • The ability to use laser-pulsed acquisitions with a laser system provided by NIST • The ability to perform synchronous voltage+laser pulsing to enhance element detection limits