AFIT - EBIC System

The United States Air Force is seeking a quotation for an Electron Beam Induced Current (EBIC) system, which consists of probes, amplifiers, and software to measure the conduction pathways and electronic characteristics of semiconductors. The system will be used at Wright Patterson Air Force Base. The contract will be awarded to the lowest priced offeror who submits a proposal that meets the requirements and receives a rating of "Acceptable" on the technical capability evaluation factor. • The EBIC system must include a double-tilt biasing sample holder, low-gain two-channel current amplification module, and FIB liftout STEM EBIC chips. • The system must be capable of measuring the conduction pathways and electronic characteristics of semiconductors. • The contractor must provide all necessary equipment, software, and documentation for the system. • The contract includes a period of performance of 8 months from the date of award.