High Power Device Analyzer

Texas State University is seeking a high-power device analyzer for electrical characterization research in semiconductor and device development. The system should support precision bias sources, multiple bias ports, and facilitate advanced power device research. It should also provide a variety of Source Measure Units (SMUs) suitable for low-power semiconductor parametric tests. The successful respondent will be required to provide on-site installation and training. • The system must support modules with high-voltage pulsing and fast IV sampling capabilities. • The system must support I-V measurements of at least 3kV/20A for both lateral and vertical device configurations. • The system must support capacitance-voltage (C-V) measurements across various frequency ranges for both lateral and vertical device configurations. • The system should accommodate wide power range up to 3kV/20A and be compatible with potential upgrade up to 10 kV/1500 A.