Tabletop Scanning Electron Microscope (SEM) with EDS

The United States Air Force Academy (USAFA) is seeking information from vendors for a tabletop/benchtop Scanning Electron Microscope (SEM) equipped with a fully integrated Energy Dispersive X-ray Spectrometer (EDS/EDX). The system must meet specific salient characteristics, including a compact design, standard laboratory counter suitability, and minimal user maintenance. The system should also include features such as auto-focus, auto-stigmator, auto-brightness, and auto-gun alignment. Interested vendors are requested to submit a capability statement that includes company profile, socio-economic status, product information, manufacturing status, and contract vehicles. • The system must be a benchtop/tabletop Scanning Electron Microscope (SEM) with fully integrated Energy Dispersive X-ray Spectroscopy (EDS/EDX) system. • The system must have a compact design suitable for standard laboratory counters, with a weight not exceeding 200 lbs. • The system must operate on standard 110VAC electrical power without requiring dedicated facility modifications or specialized infrastructure. • The system must include a compatible Uninterrupted Power Supply (UPS) and necessary vacuum pumps to achieve both high and low vacuum environments. • The system must have an electron source with a minimum expected lifetime of >3,000 hours, an accelerating voltage range of 1.0 kV to 20.0 kV, and live magnification of 150,000× minimum.