Low-Temperature (LT) Scanning Probe Microscope (SPM)

The Brookhaven Science Associates, LLC is seeking a quote for the integration of a Low-Temperature Scanning Probe Microscope (LT-SPM) into a Multiprobe UHV Surface Analysis System. The LT-SPM will include a new SPM scanner, a sample stage with seven additional electrical contacts, a removable magnetic field assembly, required internal electronics, and all necessary wiring and cabling. The system must be compatible with the existing Scienta Omicron MATRIX SPM controller. The supplier will be responsible for designing and building a UHV SPM chamber, installing all new components within the cryostat, and performing system performance and quality tests. The offeror must have previous experience fabricating, installing, and testing systems of comparable complexity, and must have a robust Quality Assurance program in place. • The LT-SPM must be integrated into the existing multiprobe system without compromising or sacrificing any original system functionality. • The supplier must provide references for at least 3 successfully fabricated, installed, tested, and delivered LT-STM/QPlus AFM of comparable complexity. • The supplier must have a robust Quality Assurance program for the design, manufacture, installation, and testing of all systems and equipment provided. • The supplier must have an instrument service engineer network in the United States.