Correlation of Process-Induced Defects and Detectability Models for Laser-Wire AM

The National Aeronautics and Space Administration (NASA) is seeking a vendor to develop detectability models for Large-Scale Laser-Wire Additive Manufacturing (LWAM). The selected vendor will receive physical LWAM Inconel 625 (IN625) samples and associated raw in-situ monitoring data provided by NASA. The vendor will be required to process the raw multi-modal monitoring signals, track all samples, perform high-resolution Computed Tomography (CT) scanning and targeted metallography, develop statistical models, and provide a report detailing recommendations for targeted, monitoring-guided inspection strategies. • The vendor shall have experience in non-destructive evaluation (NDE), statistical modeling, defect characterization, and in-situ monitoring data integration for additive manufacturing. • The vendor shall develop Probability of Detection (POD) models aligned with MIL-HDBK-1823A to quantify the defect detection capability of the in-situ monitoring system. • The vendor shall grant the Government unlimited rights to all data, reports, and algorithms generated under this SOW. • The vendor shall coordinate with NASA MSFC personnel for peer review and co-authorship on any public documentation or journal articles developed from this data prior to external publication.