Ion mill for transmission electron microscope specimens

The National Institute of Standards and Technology (NIST) is conducting market research to identify potential sources of commercial products/services that can provide an ion milling system for transmission electron microscope specimens. The system should be capable of milling/polishing specimens using one or more ion beams and have various features such as adjustable ion sources, a rotating stage, and a microscope for imaging the specimen during ion milling. The system should also be able to accommodate at least one process gas and have a vacuum system compatible with a turbo pump. Some key requirements of the system include: • The ability to hold standard 3 mm diameter transmission electron microscope grids and/or half grids • A stage that can rotate 360 degrees • Adjustable ion source energy and angle • A microscope to image the specimen during ion milling • Illumination of the specimen for microscope imaging • The ability to accommodate at least one process gas • A vacuum system compatible with a turbo pump NIST is seeking information from companies that can provide a solution that meets these requirements, and respondents should provide detailed information about their company, the equipment they can provide, and its technical specifications.