In-situ SEM nanomechanical testing system between the temperature ranges of 150 K- 1000 K

Florida State University seeks a vendor to supply a variable‑temperature in‑situ nanomechanical testing system that can be mounted inside a scanning electron microscope (SEM) and operate across a broad temperature range (150 K to 1,000 K). The procurement is issued as an Invitation to Negotiate (ITN), meaning the university will evaluate sealed proposals and negotiate terms with the selected vendor(s). The award will provide a turnkey scientific instrument, likely including installation, integration with existing SEM equipment, training, and possibly maintenance services as indicated by the inclusion of a maintenance commodity code. • Required equipment: In‑situ SEM nanomechanical testing system, temperature range 150 K‑1,000 K. • Scope may include delivery, installation, integration, user training, and post‑delivery maintenance. • Competitive sealed‑bid ITN; proposals due 22 June 2026, with a sealed‑until deadline of 3:00 PM EDT. • Primary procurement contact: Stephen J. Talevich ([email protected], (850) 645‑8207).