Micro x-ray source for defect detection in metallic AM structures.

NASA’s National Space Science Center (NSSC) is seeking a capability statement from vendors able to supply a micro‑x‑ray source for high‑resolution defect detection in thin‑walled, additively‑manufactured metallic components. The effort involves the design, fabrication (if needed), testing, and delivery of a single micro‑x‑ray unit, its compatible power supply, control software, and full technical documentation, all meeting strict performance criteria (40‑130 kV, 10‑300 µA, ≤10 µm spot size, 45‑53° cone angle, compact form factor). Milestones include order acknowledgement within one week, factory acceptance testing, and final delivery/acceptance. This is a non‑price‑based solicitation; only capability statements are requested. • Procurement of one micro‑x‑ray source with specified voltage, current, power, spot size, and geometry. • Delivery of power supply, control software, manuals, safety certifications, and test data. • Must meet IEC/EN and FCC safety standards. • Milestones: order ack (1 wk), pre‑shipment testing, final delivery. • No government‑furnished property; off‑the‑shelf hardware preferred.