16 MP EUV Vacuum Flanged Camera EUV Ptychographic Reflectometry

The National Institute of Standards and Technology (NIST) is seeking information from sources that may be capable of providing a 16 MP EUV vacuum flanged camera for EUV ptychographic reflectometry. The camera must meet specific technical specifications, including a back-illuminated charge-coupled device (CCD) sensor, high quantum efficiency, low noise, and high dynamic range. The camera must also be compatible with high-vacuum or better and have a communication interface of USB or Ethernet. Key features and requirements include: • High quantum efficiency greater than 60% for photon energies between 30 eV and 90 eV • Low noise and high dynamic range • Back-illuminated CCD sensor • Compatibility with high-vacuum or better • USB or Ethernet communication interface • Software drivers for LabVIEW • Custom, unproven products will not be considered Respondents should provide information on their company, equipment, and capabilities to meet the government's requirements, including technical specifications, performance capabilities, and pricing information.