Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Instrument

The National Institute of Standards and Technology (NIST) is seeking a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) instrument capable of performing customized measurements. The instrument should have a Ga+ ion column with a spatial resolution of better than 5 nm at 30kV, an electron column with a spatial resolution of better than 0.6 nm at eucentric working distance, and detectors with in-lens detector systems. The instrument should also have a stage system that allows for greater than 180° of "β" tilt, sample holders compatible with Cameca atom probe sample coupons, and a gas injection system with Platinum deposition. The contract will include a 5-year warranty and delivery, installation, and training. The Government will evaluate the quotations based on technical capability, experience, and price. • The instrument should meet or exceed all minimum requirements specified in the Statement of Work. • The quoter should provide a firm-fixed-price quotation for each line item. • The quoter should have prior experience delivering, installing, and providing warranty for instruments similar to those in the Statement of Work. • The Government reserves the right to make an award without discussions based solely upon initial quotes.