Atomic Force Microscope for use in a Scanning Electron Microscope

The National Institute of Standards and Technology (NIST) is seeking a quotation for an Atomic Force Microscope for use in a Scanning Electron Microscope. The microscope should meet the technical specifications outlined in the Statement of Work document. The quotation should include a firm-fixed-price for the microscope, including all shipping costs and tariffs. The Government intends to award a single firm fixed price purchase order from this solicitation. • The microscope should meet the technical specifications outlined in the Statement of Work document. • The quotation should include a firm-fixed-price for the microscope, including all shipping costs and tariffs. • The Government reserves the right not to award a purchase order and to make an award without discussions based solely upon initial quotes. • The award will be made to the lowest priced, technically acceptable offeror.