Combined Sources Sought Notice and Notice of Intent to Award a Sole Source Contract for X-ray Computed Tomography Microscope

The National Institute of Standards and Technology (NIST) is conducting market research to identify alternative sources for an X-ray Computed Tomography Microscope. The microscope will be used for micro-scale three-dimensional imaging of semiconductor materials and devices. The system must meet specific requirements, including an ultimate spatial resolution of 450 nm or smaller, a minimum achievable voxel size of 40 nm or smaller, and the ability to produce data compatible with NIST's current Zeiss Versa XRM 500 microscope system. The system shall also include a software algorithm to reconstruct collected images into a three-dimensional representation of the specimen. The contractor shall provide at least three days of on-site training for up to five NIST staff members and at least three additional days of remote applications support and/or training. • The system must include a sealed tube X-ray source with a variable source voltage from 30 kV to 160 kV and a maximum power output of 25 W or higher. • The system must include a two-stage optics-based magnification/detection system to leverage both geometric and optical magnification. • The system must include a software API such that the instrument can be fully controlled using a common scripting language. • The contractor shall provide a comprehensive warranty to cover the instrument for a period of one year. • The system must be able to be powered by either 120 V/60 Hz single phase power or 208 V/60 Hz single phase or 208 V / 60 Hz three phase power.