Intent to Award Sole Source - ION Source Replacement

The Air Force Research Laboratory Munitions Directorate (AFRL/RWTE) intends to award a sole source purchase order to Hitachi High-Tech America, Inc. for the replacement of the ION source and associated parts on the Hitachi NX9000 FIB-SEM located at Eglin Air Force Base, FL. The required parts include the LMIS2 ION source, FIB Condenser Lens Assembly, and other associated components. The NX9000 FIB-SEM supports AFRL by conducting site-specific analysis, gas deposition, ablation of materials, collecting energy dispersive X-ray spectroscopy data, or SEM images, and provides critical support to both AFRL projects and other agencies' programs related to high explosive research and development. • The LMIS2 ION source, FIB Condenser Lens Assembly, and associated parts are consumable items that need to be replaced approximately every 4000 hours of use. • The replacement of these parts is critical for producing certain research data for AFRL/RWTE and other outside agencies. • Hitachi High-Tech America is the only responsible source possessing the unique qualifications necessary to perform this work, and they have exclusive access to the required parts.