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U.S. Department Of Defense·Florida

Scanning Electron Microscope

Closes 3/30/2026$200k – $400kRequest for Quotation
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Description

The US Air Force is seeking a scanning electron microscope for research and development purposes, including user training and installation. The microscope must meet the minimum specifications identified in the salient characteristics document. The contract will be awarded to the responsible offeror whose quote conforms to the solicitation and provides the best value to the government, considering factors such as technical capability and price. Key points to consider: • The delivery term is 240 days ARO • The inspection and acceptance terms are destination/destination • The offeror must provide product literature or a specification sheet that clearly identifies that the proposed scanning electron microscope complies with the minimum specifications • The offeror must submit two separate volumes: Volume 1 - Price and Volume 2 - Technical Approach • The government reserves the right to cancel this solicitation at any time

Attached files

Contact

Nathan Koehn(Contract Administrator)

[email protected]

(850) 283-8527

Key dates

Opened
3/3/2026
Questions due
3/25/2026
Closes
3/30/2026
Duration
240 days

Last updated

Details

Type
Request for Quotation
Industry
Aerospace and Defense
NAICS
334516
Solicitation №
FA481926Q0009

Budget estimate

$200,000 – $400,000

The budget for this contract can be estimated based on the type of equipment being purchased and the delivery terms. Scanning electron microscopes can range in price from $50,000 to $500,000 or more, depending on the features and capabilities. Considering the delivery term of 240 days and the requirement for user training and installation, the budget could be on the higher end of this range. Additionally, the government's budget for research and development equipment can also be a factor in determining the budget. Therefore, a reasonable estimate for the budget could be between $200,000 and $400,000.

AI estimate from the solicitation

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