Combined Sources Sought Notice and Notice of Intent to Award a Sole Source Contract for ScanWave Pro electronic controller for a Vero AFM

The National Institute of Standards and Technology (NIST) is conducting market research to identify alternative sources for a scanning Microwave Impedance Microscopy (sMIM) electronic controller to support nanoscale impedance property measurements. The required controller will integrate with the Government-owned Vero Atomic Force Microscope (AFM) and replace the current modular assembly. The controller must provide enhanced nanoscale impedance characterization capabilities, support direct impedance measurements, and integrate with the existing customized Vero AFM holder and associated instrumentation. • The controller must be fully compatible with the Government-owned Vero AFM and the existing ScanWave 2.0 Probe Interface module. • The controller must provide scanning Microwave Impedance Microscopy (sMIM) capability for direct nanoscale impedance measurements. • The controller must replace the existing modular microwave electronics assembly with a single integrated electronic controller. • The controller must provide substantially improved measurement sensitivity over the existing measurement configuration. • The controller must integrate with the existing customized Vero AFM holder and associated instrumentation to preserve current system functionality and research workflows. • The controller must be capable of supporting multimodal characterization in conjunction with the Vero AFM's existing electrical, mechanical, thermal, and piezoelectric measurement capabilities. • The controller must include the manufacturer's standard commercial warranty.