Gas Chromatograph with Flame Ionization Detector and Pulsed Discharge Helium Ionization Detector for Impurity Analysis of Semiconductor Gases

The National Institute of Standards and Technology (NIST) is seeking information from sources that may be capable of providing a Gas Chromatograph with Flame Ionization Detector and Pulsed Discharge Helium Ionization Detector (GC-FID/PDHID) for impurity analysis of semiconductor gases. The GC-FID/PDHID will be used to develop primary standards and reference materials for "zero gas" semiconductor and electronics-grade gases. The required technical specifications include a 6-port gas sampling valve, a 10 mL sample loop, and a flow control system capable of supporting the use of packed columns. • The GC-FID/PDHID must be configured for the analysis of gases delivered through a regulator from a gas cylinder. • The GC-FID/PDHID must have a Flame Ionization Detector (FID) and a Pulsed Discharge Helium Ionization Detector (PDHID). • The GC-FID/PDHID must have software to control all GC functions, collect chromatographic data, perform data analysis, and export selected data to an Excel spreadsheet. • The GC-FID/PDHID must have an operations and maintenance manual.