Description
The National Institute of Standards and Technology (NIST) is seeking information from sources that may be capable of providing a High Resolution Confocal Raman Microscope. The microscope should have a high resolution confocal open space microscope with all associated gratings, detector, and spectroscopy software for analysis. It should also have 532 nm and 785 wavelength lasers with the ability to expand with multiple lasers, a fully motorized XYZ stage, fast imaging and mapping modes, and a high resolution detector for 200 – 1100 nm.
Some key features and requirements of the microscope include:
• High resolution confocal open space microscope with all associated gratings, detector, and spectroscopy software for analysis
• 532 nm and 785 wavelength lasers with ability to expand with multiple lasers
• Fully motorized XYZ stage
• Fast Imaging and mapping modes
• High resolution detector for 200 – 1100 nm
• Brightfield microscope for sample location
• Expansion for AFM coupling with motorized switching mirror and covered beam path
• Spectroscopic software for instrument control, data acquisition, analysis and display with licenses for running instrument as well as separate licenses for data processing
• Autofocus capabilities while navigating the sample
• Installation and operational training at the worksite
• Full support program
• Passively damped optical table with pneumatic isolated frame that is 4 ft by 8 ft with 4.8 mm skin and two tuned dampers
• A set of visible and NIR half wave plate for 90-degree rotation of the incoming laser polarization and a visible analyzer to analyze the Raman signal for the range (400-700 nm) and (700 -1100 nm) with holders and fixed scrambler (230 -2500 nm) for complete depolarization of the Raman signal
• A thermometric cell working from -196 °C to 600 °C controlled by software
• Scanning probe microscope and optical coupling platform with full performance SPM capabilities including contact, semi-contact, non-contact, lateral force microscopy, piezo force microscopy, phase contrast, magnetic force microscopy, single pass MFM, electrostatic force microscopy, single force electrostatic force microscopy, scanning kelvin probe microscopy, scanning capacitance microscopy, nanolithography
Attached files
Contact
Forest Crumpler