Field-Emission Scanning Electron Microscope (FE-SEM) with Brand Name Only Electron Backscatter Diffraction (EBSD) and Energy Dispersive Spectroscopy (EDS) Detectors and Analytical Software

This solicitation seeks a brand‑name Field‑Emission Scanning Electron Microscope (FE‑SEM) equipped with Electron Backscatter Diffraction (EBSD) and Energy Dispersive Spectroscopy (EDS) detectors, plus the required analytical software. The procurement will be made under the standard SF‑1449 format and is intended for a research or standards laboratory that requires high‑resolution imaging, crystallographic orientation mapping, and elemental analysis capabilities. The successful vendor will deliver a turnkey system, including installation, training, and warranty support. • FE‑SEM platform (brand‑only, no custom redesign) • Integrated EBSD detector for crystallographic orientation mapping • Integrated EDS detector for elemental composition analysis • Full analytical software suite compatible with the hardware • Installation, on‑site training, and post‑delivery support • Compliance with NIST procurement policies (SF‑1449)