X-ray Diffractometer

The National Institute of Standards and Technology (NIST) is conducting market research to identify potential sources of commercial products/services that satisfy the Government's anticipated needs for an X-ray diffractometer. The X-ray diffractometer will be used to verify the structure of catalysts and other materials, provide complementary data on catalysts at industrially-relevant reaction conditions, and provide a key reference point relating data from NIST's testbed to conventional techniques applied to catalysts at internal and external facilities. The X-ray diffractometer must meet specific technical requirements, including the ability to perform powder analysis in reflection or transmission mode, grazing incidence, and X-ray reflectivity measurements of thin films. • The X-ray diffractometer must have a detector with sufficient energy resolution for suppressing fluorescence from transition metals. • The X-ray diffractometer must be capable of scanning from a 2θ angle below 0° to greater than 150°. • The instrument must be a brand new, non-refurbished unit, and the unit must not be a discontinued product. • The instrumentation must operate at a voltage compatible with USA standards and be compatible with operation between 15 °C and 35 °C.